Hydrochloric acid 37,0 - 38,0%, CMOS for microelectronic, J.T.Baker®

Supplier: Avantor
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Management of Change (MOC) category = R

9529-15EA 0 EUR
9529-15 9529-4X 9529-09 9529-2J 9529-07
Hydrochloric acid 37,0 - 38,0%, CMOS for microelectronic, J.T.Baker®
Hydrochloric acid
Formula: HCl
MW: 36,46 g/mol
Boiling Pt: 110 °C (1013 hPa)
Melting Pt: –30 °C
Density: 1,18 g/cm³ (20 °C)
Storage Temperature: Ambient
MDL Number: MFCD00011324
CAS Number: 7647-01-0
EINECS: 231-595-7
UN: 1789
ADR: 8,II

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Specification Test Results

For Microelectronic Use
Store below 25°C
Assay (as HCl) (by acid-base titrn) 37.0 - 38.0 %
Color (APHA) ≤ 10
Residue after Ignition ≤ 3 ppm
Extractable Organic Substances ≤ 3 ppm
Bromide (Br) ≤ 0.005 %
Free Halogen (as Cl₂) Passes Test
Ammonium (NH₄) ≤ 1 ppm
Phosphate (PO₄) ≤ 0.05 ppm
Sulfate (SO₄) ≤ 0.3 ppm
Sulfite (SO₃) ≤ 0.8 ppm
Trace Impurities - Aluminum (Al) ≤ 50.0 ppb
Arsenic and Antimony (as As) ≤ 5.0 ppb
Trace Impurities - Barium (Ba) ≤ 20.0 ppb
Trace Impurities - Beryllium (Be) ≤ 10.0 ppb
Trace Impurities - Bismuth (Bi) ≤ 20.0 ppb
Trace Impurities - Boron (B) ≤ 20.0 ppb
Trace Impurities - Cadmium (Cd) ≤ 5.0 ppb
Trace Impurities - Calcium (Ca) ≤ 100.0 ppb
Trace Impurities - Chromium (Cr) ≤ 10.0 ppb
Trace Impurities - Cobalt (Co) ≤ 5.0 ppb
Trace Impurities - Copper (Cu) ≤ 5.0 ppb
Trace Impurities - Gallium (Ga) ≤ 20.0 ppb
Trace Impurities - Germanium (Ge) ≤ 20 ppb
Trace Impurities - Gold (Au) ≤ 20 ppb
Heavy Metals (as Pb) ≤ 100 ppb
Trace Impurities - Iron (Fe) ≤ 50.0 ppb
Trace Impurities - Lead (Pb) ≤ 20.0 ppb
Trace Impurities - Lithium (Li) ≤ 20.0 ppb
Trace Impurities - Magnesium (Mg) ≤ 50.0 ppb
Trace Impurities - Manganese (Mn) ≤ 5.0 ppb
Trace Impurities - Molybdenum (Mo) ≤ 10.0 ppb
Trace Impurities - Nickel (Ni) ≤ 10.0 ppb
Trace Impurities - Niobium (Nb) ≤ 10.0 ppb
Trace Impurities - Potassium (K) ≤ 50 ppb
Trace Impurities - Silicon (Si) ≤ 100.0 ppb
Trace Impurities - Silver (Ag) ≤ 20.0 ppb
Trace Impurities - Sodium (Na) ≤ 100.0 ppb
Trace Impurities - Strontium (Sr) ≤ 20.0 ppb
Trace Impurities - Tantalum (Ta) ≤ 10.0 ppb
Trace Impurities - Thallium (Tl) ≤ 20.0 ppb
Trace Impurities - Tin (Sn) ≤ 50 ppb
Trace Impurities - Titanium (Ti) ≤ 10.0 ppb
Trace Impurities - Vanadium (V) ≤ 10.0 ppb
Trace Impurities - Zinc (Zn) ≤ 30.0 ppb
Trace Impurities - Zirconium (Zr) ≤ 10.0 ppb
Particle Count at point of fill - 0.5 µm and greater ≤ 150 par/ml
Particle Count at point of fill - 1.0 µm and greater ≤ 25 par/ml

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