Nitric acid 65,0 - 68,0%, CMOS for microelectronic, J.T.Baker®
Supplier: Avantor
|
Danger
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9612-33EA
0
EUR
9612-33
Nitric acid 65,0 - 68,0%, CMOS for microelectronic, J.T.Baker®
Nitric acid
Formula:
HNO₃ MW: 63,01 g/mol Storage Temperature: Ambient |
MDL Number:
MFCD00011349 UN: 2031 ADR: 8,II |
Specification Test Results
For Microelectronic Use | |
Assay (HNO₃) | 65.0 - 67.9 % |
Appearance | Passes Test |
Color (APHA) | ≤ 10 |
Residue after Ignition | ≤ 2 ppm |
Chloride (Cl) | ≤ 0.08 ppm |
Phosphate (PO₄) | ≤ 0.10 ppm |
Sulfate (SO₄) | ≤ 0.2 ppm |
Trace Impurities - Aluminum (Al) | ≤ 40.0 ppb |
Arsenic and Antimony (as As) | ≤ 5.0 ppb |
Trace Impurities - Barium (Ba) | ≤ 10.0 ppb |
Trace Impurities - Beryllium (Be) | ≤ 10.0 ppb |
Trace Impurities - Bismuth (Bi) | ≤ 20.0 ppb |
Trace Impurities - Boron (B) | ≤ 10.0 ppb |
Trace Impurities - Cadmium (Cd) | ≤ 50 ppb |
Trace Impurities - Calcium (Ca) | ≤ 50.0 ppb |
Trace Impurities - Chromium (Cr) | ≤ 30.0 ppb |
Trace Impurities - Cobalt (Co) | ≤ 10.0 ppb |
Trace Impurities - Copper (Cu) | ≤ 10.0 ppb |
Trace Impurities - Gallium (Ga) | ≤ 10.0 ppb |
Trace Impurities - Germanium (Ge) | ≤ 20 ppb |
Trace Impurities - Gold (Au) | ≤ 20 ppb |
Heavy Metals (as Pb) | ≤ 100 ppb |
Trace Impurities - Iron (Fe) | ≤ 40.0 ppb |
Trace Impurities - Lead (Pb) | ≤ 20.0 ppb |
Trace Impurities - Lithium (Li) | ≤ 10.0 ppb |
Trace Impurities - Magnesium (Mg) | ≤ 20 ppb |
Trace Impurities - Manganese (Mn) | ≤ 10.0 ppb |
Trace Impurities - Nickel (Ni) | ≤ 20.0 ppb |
Trace Impurities - Niobium (Nb) | ≤ 50.0 ppb |
Trace Impurities - Potassium (K) | ≤ 50 ppb |
Trace Impurities - Silicon (Si) | ≤ 50 ppb |
Trace Impurities - Silver (Ag) | ≤ 20.0 ppb |
Trace Impurities - Sodium (Na) | ≤ 150.0 ppb |
Trace Impurities - Strontium (Sr) | ≤ 30.0 ppb |
Trace Impurities - Tantalum (Ta) | ≤ 10.0 ppb |
Trace Impurities - Thallium (Tl) | ≤ 10.0 ppb |
Trace Impurities - Tin (Sn) | ≤ 20.0 ppb |
Trace Impurities - Titanium (Ti) | ≤ 10.0 ppb |
Trace Impurities - Vanadium (V) | ≤ 10.0 ppb |
Trace Impurities - Zinc (Zn) | ≤ 20.0 ppb |
Trace Impurities - Zirconium (Zr) | ≤ 10.0 ppb |
Particle Count - 0.5 µm and greater | ≤ 60 par/ml |
Particle Count - 1.0 µm and greater | ≤ 10 par/ml |
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