Nitric acid 69% VLSI for microelectronic, J.T.Baker®

Supplier: Avantor
Danger

5371-03EA 0 EUR
5371-03
Nitric acid 69% VLSI for microelectronic, J.T.Baker®
Nitric acid
Formula: HNO₃
MW: 63,01 g/mol
Density: 1,4 g/cm³ (20 °C)
Storage Temperature: Ambient
MDL Number: MFCD00011349
UN: 2031
ADR: 8,II

Order Now

Specification Test Results

For Microelectronic Use
Assay (HNO₃) 69.0 - 70.0 %
Appearance Passes Test
Color (APHA) ≤10
Chloride (Cl) ≤0.08 ppm
Phosphate (PO₄) ≤0.05 ppm
Sulfate (SO₄) ≤0.2 ppm
Trace Impurities - Aluminum (Al) ≤20 ppb
Arsenic and Antimony (as As) ≤3.0 ppb
Trace Impurities - Barium (Ba) ≤10.0 ppb
Trace Impurities - Bismuth (Bi) ≤50 ppb
Trace Impurities - Boron (B) ≤10.0 ppb
Trace Impurities - Cadmium (Cd) ≤5.0 ppb
Trace Impurities - Calcium (Ca) ≤50.0 ppb
Trace Impurities - Chromium (Cr) ≤30.0 ppb
Trace Impurities - Cobalt (Co) ≤5.0 ppb
Trace Impurities - Copper (Cu) ≤5.0 ppb
Trace Impurities - Gallium (Ga) ≤10.0 ppb
Trace Impurities - Germanium (Ge) ≤10.0 ppb
Trace Impurities - Gold (Au) ≤10.0 ppb
Trace Impurities - Iron (Fe) ≤50.0 ppb
Trace Impurities - Lead (Pb) ≤20.0 ppb
Trace Impurities - Lithium (Li) ≤10.0 ppb
Trace Impurities - Magnesium (Mg) ≤30.0 ppb
Trace Impurities - Manganese (Mn) ≤5.0 ppb
Trace Impurities - Nickel (Ni) ≤10.0 ppb
Trace Impurities - Niobium (Nb) ≤50.0 ppb
Trace Impurities - Potassium (K) ≤20.0 ppb
Trace Impurities - Silicon (Si) ≤60.0 ppb
Trace Impurities - Silver (Ag) ≤10.0 ppb
Trace Impurities - Sodium (Na) ≤60.0 ppb
Trace Impurities - Strontium (Sr) ≤10.0 ppb
Trace Impurities - Tin (Sn) ≤10.0 ppb
Trace Impurities - Titanium (Ti) ≤50.0 ppb
Trace Impurities - Zinc (Zn) ≤10.0 ppb
Particle Count - 0.5 µm and greater ≤90 par/ml
Particle Count - 1.0 µm and greater ≤10 par/ml
Reported value is the average of all samples counted for this lot number,with no individual sample value exceeding the specification.

Learn more

About VWR

Avantor is a vertically integrated, global supplier of discovery-to-delivery solutions for...

Learn more About VWR