Orthophosphoric acid ≥85%, Finyte® for microelectronic, J.T.Baker®
Supplier: Avantor
5854-05EA
516
EUR
5854-05
Orthophosphoric acid ≥85%, Finyte® for microelectronic, J.T.Baker®
Orthophosphoric acid
Formula:
H₃PO₄ MW: 98 g/mol |
MDL Number:
MFCD00011340 UN: 1805 ADR: 8,III |
Specification Test Results
For Microelectronic Use | |
Store at temperatures above 22°C (72°F) | |
Assay (H₃PO₄) (by acidimetry) | 85.0 - 87.0 % |
Color (APHA) | ≤10 |
Volatile Acids (µeq/g) | ≤0.16 |
Chloride (Cl) | ≤0.7 ppm |
Nitrate (NO₃) | ≤1.5 ppm |
Sulfate (SO₄) | ≤8 ppm |
Trace Impurities - Aluminum (Al) | ≤400.0 ppb |
Trace Impurities - Antimony (Sb) | ≤6000.0 ppb |
Trace Impurities - Arsenic (As) | ≤50.0 ppb |
Trace Impurities - Calcium (Ca) | ≤450.0 ppb |
Trace Impurities - Chromium (Cr) | ≤200.0 ppb |
Trace Impurities - Cobalt (Co) | ≤50.0 ppb |
Trace Impurities - Copper (Cu) | ≤50 ppb |
Trace Impurities - Gold (Au) | ≤150.0 ppb |
Trace Impurities - Iron (Fe) | ≤700.0 ppb |
Trace Impurities - Lead (Pb) | ≤100 ppb |
Trace Impurities - Lithium (Li) | ≤100.0 ppb |
Trace Impurities - Magnesium (Mg) | ≤100.0 ppb |
Trace Impurities - Manganese (Mn) | ≤100.0 ppb |
Trace Impurities - Nickel (Ni) | ≤200.0 ppb |
Trace Impurities - Potassium (K) | ≤200.0 ppb |
Trace Impurities - Sodium (Na) | ≤500.0 ppb |
Trace Impurities - Strontium (Sr) | ≤100.0 ppb |
Trace Impurities - Titanium (Ti) | ≤300.0 ppb |
Trace Impurities - Zinc (Zn) | ≤300.0 ppb |
Particle Count at point of fill - 0.5 µm and greater | ≤50 par/ml |
Particle Count at point of fill - 1.0 µm and greater | ≤10 par/ml |
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