Toluene, CMOS for microelectronic, J.T.Baker®
Supplier: Avantor
9466-03EA
0
EUR
9466-03
Toluene, CMOS for microelectronic, J.T.Baker®
Toluene
Formula:
C₆H₅CH₃ MW: 92,14 g/mol |
MDL Number:
MFCD00008512 CAS Number: 108-88-3 UN: 1294 ADR: 3,II |
Specification Test Results
For Microelectronic Use | |
Assay (C₆H₅CH₃) (by GC) | ≥99.5 % |
Color (APHA) | ≤10 |
Acidity (µeq/g) | ≤0.2 |
Residue after Evaporation | ≤2.0 ppm |
Water (by KF, coulometric) | ≤0.03 % |
Substances Darkened by H₂SO₄ | Passes Test |
Sulfur Compounds (as S) | ≤0.003 % |
Chloride (Cl) | ≤2 ppm |
Phosphate (PO₄) | ≤0.5 ppm |
Trace Impurities - Aluminum (Al) | ≤20 ppb |
Arsenic and Antimony (as As) | ≤10.0 ppb |
Trace Impurities - Barium (Ba) | ≤10.0 ppb |
Trace Impurities - Boron (B) | ≤20.0 ppb |
Trace Impurities - Cadmium (Cd) | ≤20.0 ppb |
Trace Impurities - Calcium (Ca) | ≤100.0 ppb |
Trace Impurities - Chromium (Cr) | ≤10.0 ppb |
Trace Impurities - Cobalt (Co) | ≤20 ppb |
Trace Impurities - Copper (Cu) | ≤20.0 ppb |
Trace Impurities - Gallium (Ga) | ≤50 ppb |
Trace Impurities - Germanium (Ge) | ≤50.0 ppb |
Trace Impurities - Gold (Au) | ≤20 ppb |
Heavy Metals (as Pb) | ≤500.0 ppb |
Trace Impurities - Iron (Fe) | ≤20.0 ppb |
Trace Impurities - Lithium (Li) | ≤20.0 ppb |
Trace Impurities - Magnesium (Mg) | ≤10.0 ppb |
Trace Impurities - Manganese (Mn) | ≤10.0 ppb |
Trace Impurities - Nickel (Ni) | ≤20.0 ppb |
Trace Impurities - Potassium (K) | ≤50 ppb |
Trace Impurities - Silicon (Si) | ≤100.0 ppb |
Trace Impurities - Silver (Ag) | ≤20.0 ppb |
Trace Impurities - Sodium (Na) | ≤100.0 ppb |
Trace Impurities - Strontium (Sr) | ≤10.0 ppb |
Trace Impurities - Tin (Sn) | ≤30.0 ppb |
Trace Impurities - Zinc (Zn) | ≤20.0 ppb |
Particle Count - 1.0 µm and greater | ≤10 par/ml |
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