Toluene, CMOS for microelectronic, J.T.Baker®

Supplier: Avantor

9466-03EA 0 EUR
9466-03
Toluene, CMOS for microelectronic, J.T.Baker®
Toluene
Formula: C₆H₅CH₃
MW: 92,14 g/mol
MDL Number: MFCD00008512
CAS Number: 108-88-3
UN: 1294
ADR: 3,II
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Specification Test Results

For Microelectronic Use
Assay (C₆H₅CH₃) (by GC) ≥99.5 %
Color (APHA) ≤10
Acidity (µeq/g) ≤0.2
Residue after Evaporation ≤2.0 ppm
Water (by KF, coulometric) ≤0.03 %
Substances Darkened by H₂SO₄ Passes Test
Sulfur Compounds (as S) ≤0.003 %
Chloride (Cl) ≤2 ppm
Phosphate (PO₄) ≤0.5 ppm
Trace Impurities - Aluminum (Al) ≤20 ppb
Arsenic and Antimony (as As) ≤10.0 ppb
Trace Impurities - Barium (Ba) ≤10.0 ppb
Trace Impurities - Boron (B) ≤20.0 ppb
Trace Impurities - Cadmium (Cd) ≤20.0 ppb
Trace Impurities - Calcium (Ca) ≤100.0 ppb
Trace Impurities - Chromium (Cr) ≤10.0 ppb
Trace Impurities - Cobalt (Co) ≤20 ppb
Trace Impurities - Copper (Cu) ≤20.0 ppb
Trace Impurities - Gallium (Ga) ≤50 ppb
Trace Impurities - Germanium (Ge) ≤50.0 ppb
Trace Impurities - Gold (Au) ≤20 ppb
Heavy Metals (as Pb) ≤500.0 ppb
Trace Impurities - Iron (Fe) ≤20.0 ppb
Trace Impurities - Lithium (Li) ≤20.0 ppb
Trace Impurities - Magnesium (Mg) ≤10.0 ppb
Trace Impurities - Manganese (Mn) ≤10.0 ppb
Trace Impurities - Nickel (Ni) ≤20.0 ppb
Trace Impurities - Potassium (K) ≤50 ppb
Trace Impurities - Silicon (Si) ≤100.0 ppb
Trace Impurities - Silver (Ag) ≤20.0 ppb
Trace Impurities - Sodium (Na) ≤100.0 ppb
Trace Impurities - Strontium (Sr) ≤10.0 ppb
Trace Impurities - Tin (Sn) ≤30.0 ppb
Trace Impurities - Zinc (Zn) ≤20.0 ppb
Particle Count - 1.0 µm and greater ≤10 par/ml

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