Xylene (mixture of isomers) ≥99.5%, CMOS for microelectronic, J.T.Baker®
Supplier: Avantor
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9493-03EA
160
EUR
9493-03
9493-14
Xylene (mixture of isomers) ≥99.5%, CMOS for microelectronic, J.T.Baker®
Xylene (mixture of isomers)
Formula:
C₆H₄(CH₃)₂ MW: 106,17 g/mol Boiling Pt: 140 °C (1013 hPa) Melting Pt: –34 °C Density: 0,86…0.88 g/cm³ (20 °C) Flash Pt: 25 °C |
MDL Number:
MFCD00077264 CAS Number: 1330-20-7 UN: 1307 ADR: 3,III Merck Index: 13,10136 |
Specification Test Results
For Microelectronic Use | |
Color (APHA) | ≤10 |
Residue after Evaporation | ≤5 ppm |
Acidity (µeq/g) | ≤0.3 |
Water (H₂O) | ≤0.02 % |
Chloride (Cl) | ≤3 ppm |
Phosphate (PO₄) | ≤0.5 ppm |
Trace Impurities - Aluminum (Al) | ≤50.0 ppb |
Arsenic and Antimony (as As) | ≤10.0 ppb |
Trace Impurities - Barium (Ba) | ≤20.0 ppb |
Trace Impurities - Boron (B) | ≤20.0 ppb |
Trace Impurities - Cadmium (Cd) | ≤20.0 ppb |
Trace Impurities - Calcium (Ca) | ≤50.0 ppb |
Trace Impurities - Chromium (Cr) | ≤50 ppb |
Trace Impurities - Cobalt (Co) | ≤20 ppb |
Trace Impurities - Copper (Cu) | ≤10.0 ppb |
Trace Impurities - Gallium (Ga) | ≤50 ppb |
Trace Impurities - Germanium (Ge) | ≤100.0 ppb |
Trace Impurities - Gold (Au) | ≤50 ppb |
Heavy Metals (as Pb) | ≤1000.0 ppb |
Trace Impurities - Iron (Fe) | ≤50.0 ppb |
Trace Impurities - Lead (Pb) | ≤100 ppb |
Trace Impurities - Lithium (Li) | ≤50.0 ppb |
Trace Impurities - Magnesium (Mg) | ≤20 ppb |
Trace Impurities - Manganese (Mn) | ≤20.0 ppb |
Trace Impurities - Nickel (Ni) | ≤10.0 ppb |
Trace Impurities - Potassium (K) | ≤100 ppb |
Trace Impurities - Silicon (Si) | ≤200.0 ppb |
Trace Impurities - Silver (Ag) | ≤50 ppb |
Trace Impurities - Sodium (Na) | ≤100.0 ppb |
Trace Impurities - Strontium (Sr) | ≤20.0 ppb |
Trace Impurities - Tin (Sn) | ≤100 ppb |
Trace Impurities - Zinc (Zn) | ≤20.0 ppb |
Particle Count - 1.0 µm and greater | ≤10 par/ml |
Total of p-, m-, o-xylene, toluene and ethylbenzene (by GC) | ≥99.5 % |
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